Penulis: Asmida Herawati
Tahun terbit: 2023
Jumlah halaman: 96
Dimensi: 15.5 x 23 cm
Penerbit: Yayasan Sahabat Alam Rafflesia
ISBN: 978-623-427-214-7
Sinopsis: In Chapter 1, the journey begins as we delve into the intriguing realm of Optical Interference, unraveling the complexities of superimposed light waves and their profound implications. This comprehension serves as the gateway to unraveling the mysteries of thin films and multilayer structures, which become the focal points of subsequent chapters. Chapter 2 is dedicated to the exploration of Optical Interference in Thin Films, offering insights into how light interacts with these thin material layers, pivotal in various technological applications. Chapter 3 delves deeper into the intricacies of Multilayer Structures, vital components of advanced optical devices and coatings. Moving on to Chapter 4, the focus shifts to the Principles of Ellipsometry, a potent technique for characterizing material optical properties, catering to both novices and experts in the field. Chapter 5 introduces the Jones Matrix, a mathematical tool critical for analyzing light polarization and interpreting ellipsometric measurements. Chapter 6 opens the door to the world of Rotating-Analyzer Ellipsometry (RAE), enhancing precision in material study. Lastly, in Chapter 7, the practical aspects of Calibrating an ellipsometer using standard materials are explored, ensuring the accuracy and reliability of measurements, making this chapter a valuable resource for researchers and technicians alike.